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Thank you for your interest in Hickok Incorporated part number 902-470, a Test Set Semiconduc product we carry that is featured with the NSN 6625-00-179-5844. This component is ready for purchase at any time, so you are encouraged to complete the Request for Quote (RFQ) form provided below if you would like to obtain pricing information for your consideration. All we ask is that you supply us with essential details like desired item quantities, target price, and when fulfillment is expected, as this will ensure our response caters to any distinct specifications.
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At ASAP Semiconductor, our goal is to make the process of finding and securing precise components simple, which is why we present vital listing details with each offering here on Boundless Aerospace. For instance, part number 902-470 was manufactured by Hickok Incorporated under the CAGECode 28569, and with the NSN 6625-00-179-5844, it belongs to FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments. More than that, all our inventory is delivered with any pertinent qualifying certifications or manufacturer trace documentation for your further benefit. Bearing all of this in mind, be sure to request a quote for part number 902-470 today, and we will be in touch as soon as possible.
MRC | Criteria | Characteristic |
---|---|---|
AFHS | ACCESSORY COMPONENT QUANTITY | 1 AND 1 AND 1 AND 1 |
ACYN | AC VOLTAGE RATING | 115.0 VOLTS NOMINAL |
FAAZ | PHASE | SINGLE |
AQXY | TEST TYPE FOR WHICH DESIGNED | TRANSISTOR BETA AND TRANSCONDUCTANCE MEASUREMENTS;DIODE AND TRANSISTOR ELECTRODE RESISTANCE;DIODE AND TRANSISTOR REVERSE LEAKAGE MEASUREMENTS;SHORTED OR OPEN DIODE TEST;BATTERY TESTS |
ANPZ | INCLOSURE FEATURE | SINGLE ITEM W/CARRYING CASE |
ACYR | DC VOLTAGE RATING | 2.0 VOLTS MINIMUM AND 9.0 VOLTS MAXIMUM |
AKWB | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM TYPE NUMBER | TYPE NO. AN/USM-206A |
ABRY | LENGTH | 9.000 INCHES NOMINAL |
ANNQ | MATERIAL AND LOCATION | PLASTIC CARRYING CASE |
AKWA | JOINT ELECTRONICS TYPE DESIGNATION SYSTEM ITEM NAME | TEST,SEMICONDUCTOR DEVICE |
AQXZ | OPERATING TEST CAPABILITY | METER;MICROMHOS;BETA;LEAKAGE TEST;BATTERY TEST |
AKVY | ACCESSORY CONTROLLING AGENCY | JETDS AND JETDS AND JETDS AND JETDS |
AKVZ | ACCESSORY IDENTIFYING NUMBER | TS-2798/USM-206A TYPE NO. AND CW-1049/USM-206A TYPE NO. AND CX-11898/USM-206A TYPE NO. AND MX-6825A/USM-206A TYPE NO. |
ALSF | INTERNAL BATTERY ACCOMMODATION | INCLUDED |
HGTH | HEIGHT | 10.000 INCHES NOMINAL |
AEAS | MAJOR COMPONENTS | TEST SET,SEMICONDUCTOR DEVICE;COVER,TEST SET;LEAD,TEST;PROD,TEST |
ACZB | FREQUENCY RATING | 50.0 HERTZ MINIMUM AND 60.0 HERTZ MAXIMUM |
ABGL | WIDTH | 8.000 INCHES NOMINAL |
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